On the Estimation of Rough Surface Parameters from Surface Profile Data — Correlation Length Estimate Using a Surface Slope Function : Recent Progress in Electromagnetic Theory and Its Application

On the Estimation of Rough Surface Parameters from Surface Profile Data — Correlation Length Estimate Using a Surface Slope Function : Recent Progress in Electromagnetic Theory and Its Application

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Veröffentlicht in:IEICE transactions on electronics 2010, Vol.93 (1), p.89-93
Hauptverfasser: NISHIMOTO, Masahiko, OGATA, Kohichi
Format: Artikel
Sprache:eng
Schlagworte:
Applied classical electromagnetism
Applied sciences
Diffraction, scattering, reflection
Electromagnetic wave propagation, radiowave propagation
Electromagnetism
electron and ion optics
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Physics
Radiocommunications
Radiowave propagation
Telecommunications
Telecommunications and information theory
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ISSN:0916-8524
1745-1353