A new technology for nanohardness measurements : principle and applications

Bibliographische Detailangaben

Hauptverfasser:	WOIRGARD, J, DARGENTON, J.-C, TROMAS, C, AUDURIER, V
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Mechanical and acoustical properties Physical properties of thin films, nonelectronic Physics Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
Online-Zugang:	Volltext
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