Photon emission from clean and oxygenated Si and SiO2 surfaces bombarded by 5 keV krypton ions
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| Veröffentlicht in: | Applied surface science 2009-10, Vol.256 (1), p.116-119 |
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| container_end_page | 119 |
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| container_issue | 1 |
| container_start_page | 116 |
| container_title | Applied surface science |
| container_volume | 256 |
| creator | KADDOURI, A ASHRAF, I AIT EL FQIH, M TARGAOUI, H EL BOUJLAÏDI, A BERRADA, K |
| description | |
| doi_str_mv | 10.1016/j.apsusc.2009.07.087 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0169-4332 |
| ispartof | Applied surface science, 2009-10, Vol.256 (1), p.116-119 |
| issn | 0169-4332 1873-5584 |
| language | eng |
| recordid | cdi_pascalfrancis_primary_22612411 |
| source | Access via ScienceDirect (Elsevier) |
| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Physics |
| title | Photon emission from clean and oxygenated Si and SiO2 surfaces bombarded by 5 keV krypton ions |
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