Raman spectroscopy determination of composition and strain in Si1-xGex/Si heterostructures

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Bibliographische Detailangaben
Hauptverfasser:	PEZZOLI, F, BONERA, E, BAUER, G, GRILLI, E, GUZZI, M, SANGUINETTI, S, CHRASTINA, D, ISELLA, G, VON KÄNEL, H, WINTERSBERGER, E, STANGL, J
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Applied sciences Compound structure devices Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Electronics Exact sciences and technology Fullerenes and related materials Infrared and raman spectra and scattering Lattice dynamics Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Phonons in low-dimensional structures and small particles Physics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online-Zugang:	Volltext
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