High photocarrier mobility in ultrafast ion-irradiated In0.53Ga0.47As for terahertz applications

Optical pump-terahertz (THz) probe spectroscopy was used for investigation of electron dynamics in In0.53Ga0.47As films irradiated by heavy ions (Br+) at doses from 109 to 1012 cm-2. From the transient conductivity spectra, photoexcited electron lifetimes and mobilities were determined; their decrea...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of physics. D, Applied physics Applied physics, 2009-10, Vol.42 (19), p.195103-195103 (6)
Hauptverfasser: Delagnes, J C, Mounaix, P, Němec, H, Fekete, L, Kadlec, F, Kužel, P, Martin, M, Mangeney, J
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Optical pump-terahertz (THz) probe spectroscopy was used for investigation of electron dynamics in In0.53Ga0.47As films irradiated by heavy ions (Br+) at doses from 109 to 1012 cm-2. From the transient conductivity spectra, photoexcited electron lifetimes and mobilities were determined; their decrease is observed upon increase in the irradiation dose. At the highest dose, the material combines an electron lifetime of 0.46 ps with an exceptionally high photoexcited electron mobility of 3600 cm2 V-1 s-1. This last value is even higher than those reported for low-temperature-grown GaAs with similar electron lifetime. Due to its rather low band gap, heavy-ion irradiated In0.53Ga0.47As shows promising properties for the development of THz systems using telecommunication based technology.
ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/42/19/195103