HTS Josephson Junction Cantilever Microscopy of Microwave Devices

Josephson junctions from the high-temperature superconductor YBa 2 Cu 3 O 7 are routinely used on a cantilever to detect spatially resolved microwave emission from room temperature microwave devices. The Josephson junctions are operated in a temperature range between 40 K to 80 K cooled by a cryo-co...

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Veröffentlicht in:	IEEE transactions on applied superconductivity 2009-06, Vol.19 (3), p.719-721
Hauptverfasser:	Stewing, F., Brendel, C., Schilling, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences BUILDING CONSTRUCTION APPLICATIONS COPPER OXIDE Devices Electrical engineering. Electrical power engineering Electromagnets Electronic equipment and fabrication. Passive components, printed wiring boards, connectics ELECTRONIC PRODUCTS Electronics Exact sciences and technology High temperature superconductors Josephson junctions Josephson radiation detectors MICROSCOPY Microwave and submillimeter wave devices, electron transfer devices microwave circuits Microwave devices MICROWAVES Radiation distribution Semiconductor device measurement Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Spatial resolution Superconducting devices Superconducting microwave devices SUPERCONDUCTIVITY SUPERCONDUCTORS Surface chemistry Surface topography Temperature distribution Testing Various equipment and components YBCO superconductors YTTRIUM OXIDE
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