Process-Induced Variability of Nb/Al/AlOx/Nb Junctions in Superconductor Integrated Circuits and Protection Against It

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Bibliographische Detailangaben
Hauptverfasser:	TOLPYGO, Sergey K, AMPARO, Denis, YOHANNES, Daniel T, MECKBACH, Max, KIRICHENKO, Alex F
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Applied sciences Design. Technologies. Operation analysis. Testing Electrical engineering. Electrical power engineering Electromagnets Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Superconducting devices Testing, measurement, noise and reliability Various equipment and components
Online-Zugang:	Volltext
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