Synchrotron topographic studies of growth defects in the core of a SrLaGaO4 single crystal

Samples cut out from different regions of SrLaGaO4 (SLG) single crystal grown along [001]‐direction were studied with a number of X‐ray diffraction topographic methods exploring both conventional and synchrotron X‐ray sources. The synchrotron investigation included in particular white beam projection transmission topography at ultra short wavelength and taking monochromatic beam topographs at different points of the rocking curves at different azimuths. The methods enabled the evaluation of the character of lattice deformation connected with the characteristic ‘rod‐like’ defects observed in the core region of the crystal. A shrinkage of the material inside the defects was indicated.