Application Exploration for 3-D Integrated Circuits: TCAM, FIFO, and FFT Case Studies : Nanocircuits and systems

Bibliographische Detailangaben

Veröffentlicht in:	IEEE transactions on very large scale integration (VLSI) systems 2009, Vol.17 (4), p.496-506
Hauptverfasser:	RHETT DAVIS, W, EUN CHU OH, SULE, Ambarish M, FRANZON, Paul D
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits Integrated circuits by function (including memories and processors) Magnetic and optical mass memories Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Storage and reproduction of information
Online-Zugang:	Volltext
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