Negative Differential Resistance Circuit Design and Memory Applications

Based on a circuit point of view, a high-performance negative differential resistance (NDR) element is designed and a possible compact device implementation is presented. The NDR structure exhibits ultrahigh peak-to-valley current ratio and also high switching speed. The corresponding process and de...

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Veröffentlicht in:IEEE transactions on electron devices 2009-04, Vol.56 (4), p.634-640
Hauptverfasser: Shu-Lu Chen, Griffin, P.B., Plummer, J.D.
Format: Artikel
Sprache:eng
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Zusammenfassung:Based on a circuit point of view, a high-performance negative differential resistance (NDR) element is designed and a possible compact device implementation is presented. The NDR structure exhibits ultrahigh peak-to-valley current ratio and also high switching speed. The corresponding process and design are completely compatible with contemporary Si CMOS technology, as they rely on coupled transistor structures. A single-NDR element static-random-access-memory cell prototype with a compact size and high speed is proposed as an interesting application suitable for embedded memory.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2009.2014194