Negative Differential Resistance Circuit Design and Memory Applications
Based on a circuit point of view, a high-performance negative differential resistance (NDR) element is designed and a possible compact device implementation is presented. The NDR structure exhibits ultrahigh peak-to-valley current ratio and also high switching speed. The corresponding process and de...
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Veröffentlicht in: | IEEE transactions on electron devices 2009-04, Vol.56 (4), p.634-640 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Based on a circuit point of view, a high-performance negative differential resistance (NDR) element is designed and a possible compact device implementation is presented. The NDR structure exhibits ultrahigh peak-to-valley current ratio and also high switching speed. The corresponding process and design are completely compatible with contemporary Si CMOS technology, as they rely on coupled transistor structures. A single-NDR element static-random-access-memory cell prototype with a compact size and high speed is proposed as an interesting application suitable for embedded memory. |
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ISSN: | 0018-9383 1557-9646 |
DOI: | 10.1109/TED.2009.2014194 |