The Electromagnetic Compatibility of Integrated Circuits-Past, Present, and Future

Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today's billon-transistor system-on-chip, there have always been concerns about the ability of components to operate safely in an increasingly disruptive electromagnetic env...

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Veröffentlicht in:IEEE Transactions on Electromagnetic Compatibility 2009-02, Vol.51 (1), p.78-100
Hauptverfasser: Ramdani, M., Sicard, E., Boyer, A., Ben Dhia, S., Whalen, J.J., Hubing, T.H., Coenen, M., Wada, O.
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container_end_page 100
container_issue 1
container_start_page 78
container_title IEEE Transactions on Electromagnetic Compatibility
container_volume 51
creator Ramdani, M.
Sicard, E.
Boyer, A.
Ben Dhia, S.
Whalen, J.J.
Hubing, T.H.
Coenen, M.
Wada, O.
description Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today's billon-transistor system-on-chip, there have always been concerns about the ability of components to operate safely in an increasingly disruptive electromagnetic environment. This paper provides a nonexhaustive review of the research work conducted in the field of electromagnetic compatibility (EMC) at the IC level over the past 40 years. It also brings together a collection of information and trends in IC technology, in order to build a tentative roadmap for the EMC of ICs until the year 2020, with a focus on measurement methods and modeling approaches.
doi_str_mv 10.1109/TEMC.2008.2008907
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_pascalfrancis_primary_21474028</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4785172</ieee_id><sourcerecordid>34710111</sourcerecordid><originalsourceid>FETCH-LOGICAL-c540t-42b46fc03f0fa23eb791fa9b909c95b5788fa77a384bc56c2ea41ec8bcb98cd73</originalsourceid><addsrcrecordid>eNpdkU1r3DAQhkVpoNu0P6D0YgoJBOpUkiVLOgazaQIbGsoWehNj7ShR8NobSQ7k38fuLnvoZT6fmWF4CfnC6CVj1PxYL--aS06p_mcMVe_IgkmpS6bV3_dkQSnTpamU_EA-pvQ0pULyakF-rx-xWHbochy28NBjDq5ohu0OcmhDF_JrMfjits_4ECHjpmhCdGPIqbyHlL8X9xET9lMA_aa4HvMY8RM58dAl_Hzwp-TP9XLd3JSrXz9vm6tV6aSguRS8FbV3tPLUA6-wVYZ5MK2hxhnZSqW1B6Wg0qJ1snYcQTB0unWt0W6jqlNysd_7CJ3dxbCF-GoHCPbmamXnGuXTi7WmL2xiz_fsLg7PI6ZstyE57DrocRiTrYRilLEZ_PYf-DSMsZ_-sFoqzmvF6wlie8jFIaWI_nieUTvLYWc57KyEPcgxzZwdFkNy0PkIvQvpOMiZUIJyPXFf91xAxGNbKC2Z4tUbuD-SMA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>857226726</pqid></control><display><type>article</type><title>The Electromagnetic Compatibility of Integrated Circuits-Past, Present, and Future</title><source>IEEE Electronic Library (IEL)</source><creator>Ramdani, M. ; Sicard, E. ; Boyer, A. ; Ben Dhia, S. ; Whalen, J.J. ; Hubing, T.H. ; Coenen, M. ; Wada, O.</creator><creatorcontrib>Ramdani, M. ; Sicard, E. ; Boyer, A. ; Ben Dhia, S. ; Whalen, J.J. ; Hubing, T.H. ; Coenen, M. ; Wada, O.</creatorcontrib><description>Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today's billon-transistor system-on-chip, there have always been concerns about the ability of components to operate safely in an increasingly disruptive electromagnetic environment. This paper provides a nonexhaustive review of the research work conducted in the field of electromagnetic compatibility (EMC) at the IC level over the past 40 years. It also brings together a collection of information and trends in IC technology, in order to build a tentative roadmap for the EMC of ICs until the year 2020, with a focus on measurement methods and modeling approaches.</description><identifier>ISSN: 0018-9375</identifier><identifier>EISSN: 1558-187X</identifier><identifier>DOI: 10.1109/TEMC.2008.2008907</identifier><identifier>CODEN: IEMCAE</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Design. Technologies. Operation analysis. Testing ; Electromagnetic compatibility ; Electromagnetics ; Electromagnetism ; Electronics ; Emission ; Engineering Sciences ; Exact sciences and technology ; history ; ICs ; Information, signal and communications theory ; Integrated circuit modeling ; Integrated circuits ; modeling ; roadmap ; Semiconductor device measurement ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; susceptibility ; System-on-a-chip ; Telecommunications and information theory ; Transistors</subject><ispartof>IEEE Transactions on Electromagnetic Compatibility, 2009-02, Vol.51 (1), p.78-100</ispartof><rights>2009 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c540t-42b46fc03f0fa23eb791fa9b909c95b5788fa77a384bc56c2ea41ec8bcb98cd73</citedby><cites>FETCH-LOGICAL-c540t-42b46fc03f0fa23eb791fa9b909c95b5788fa77a384bc56c2ea41ec8bcb98cd73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4785172$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,313,314,776,780,788,792,881,27901,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4785172$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=21474028$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-02523680$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Ramdani, M.</creatorcontrib><creatorcontrib>Sicard, E.</creatorcontrib><creatorcontrib>Boyer, A.</creatorcontrib><creatorcontrib>Ben Dhia, S.</creatorcontrib><creatorcontrib>Whalen, J.J.</creatorcontrib><creatorcontrib>Hubing, T.H.</creatorcontrib><creatorcontrib>Coenen, M.</creatorcontrib><creatorcontrib>Wada, O.</creatorcontrib><title>The Electromagnetic Compatibility of Integrated Circuits-Past, Present, and Future</title><title>IEEE Transactions on Electromagnetic Compatibility</title><addtitle>TEMC</addtitle><description>Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today's billon-transistor system-on-chip, there have always been concerns about the ability of components to operate safely in an increasingly disruptive electromagnetic environment. This paper provides a nonexhaustive review of the research work conducted in the field of electromagnetic compatibility (EMC) at the IC level over the past 40 years. It also brings together a collection of information and trends in IC technology, in order to build a tentative roadmap for the EMC of ICs until the year 2020, with a focus on measurement methods and modeling approaches.</description><subject>Applied sciences</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electromagnetic compatibility</subject><subject>Electromagnetics</subject><subject>Electromagnetism</subject><subject>Electronics</subject><subject>Emission</subject><subject>Engineering Sciences</subject><subject>Exact sciences and technology</subject><subject>history</subject><subject>ICs</subject><subject>Information, signal and communications theory</subject><subject>Integrated circuit modeling</subject><subject>Integrated circuits</subject><subject>modeling</subject><subject>roadmap</subject><subject>Semiconductor device measurement</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>susceptibility</subject><subject>System-on-a-chip</subject><subject>Telecommunications and information theory</subject><subject>Transistors</subject><issn>0018-9375</issn><issn>1558-187X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkU1r3DAQhkVpoNu0P6D0YgoJBOpUkiVLOgazaQIbGsoWehNj7ShR8NobSQ7k38fuLnvoZT6fmWF4CfnC6CVj1PxYL--aS06p_mcMVe_IgkmpS6bV3_dkQSnTpamU_EA-pvQ0pULyakF-rx-xWHbochy28NBjDq5ohu0OcmhDF_JrMfjits_4ECHjpmhCdGPIqbyHlL8X9xET9lMA_aa4HvMY8RM58dAl_Hzwp-TP9XLd3JSrXz9vm6tV6aSguRS8FbV3tPLUA6-wVYZ5MK2hxhnZSqW1B6Wg0qJ1snYcQTB0unWt0W6jqlNysd_7CJ3dxbCF-GoHCPbmamXnGuXTi7WmL2xiz_fsLg7PI6ZstyE57DrocRiTrYRilLEZ_PYf-DSMsZ_-sFoqzmvF6wlie8jFIaWI_nieUTvLYWc57KyEPcgxzZwdFkNy0PkIvQvpOMiZUIJyPXFf91xAxGNbKC2Z4tUbuD-SMA</recordid><startdate>20090201</startdate><enddate>20090201</enddate><creator>Ramdani, M.</creator><creator>Sicard, E.</creator><creator>Boyer, A.</creator><creator>Ben Dhia, S.</creator><creator>Whalen, J.J.</creator><creator>Hubing, T.H.</creator><creator>Coenen, M.</creator><creator>Wada, O.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope><scope>1XC</scope></search><sort><creationdate>20090201</creationdate><title>The Electromagnetic Compatibility of Integrated Circuits-Past, Present, and Future</title><author>Ramdani, M. ; Sicard, E. ; Boyer, A. ; Ben Dhia, S. ; Whalen, J.J. ; Hubing, T.H. ; Coenen, M. ; Wada, O.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c540t-42b46fc03f0fa23eb791fa9b909c95b5788fa77a384bc56c2ea41ec8bcb98cd73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Applied sciences</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electromagnetic compatibility</topic><topic>Electromagnetics</topic><topic>Electromagnetism</topic><topic>Electronics</topic><topic>Emission</topic><topic>Engineering Sciences</topic><topic>Exact sciences and technology</topic><topic>history</topic><topic>ICs</topic><topic>Information, signal and communications theory</topic><topic>Integrated circuit modeling</topic><topic>Integrated circuits</topic><topic>modeling</topic><topic>roadmap</topic><topic>Semiconductor device measurement</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>susceptibility</topic><topic>System-on-a-chip</topic><topic>Telecommunications and information theory</topic><topic>Transistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ramdani, M.</creatorcontrib><creatorcontrib>Sicard, E.</creatorcontrib><creatorcontrib>Boyer, A.</creatorcontrib><creatorcontrib>Ben Dhia, S.</creatorcontrib><creatorcontrib>Whalen, J.J.</creatorcontrib><creatorcontrib>Hubing, T.H.</creatorcontrib><creatorcontrib>Coenen, M.</creatorcontrib><creatorcontrib>Wada, O.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>IEEE Transactions on Electromagnetic Compatibility</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ramdani, M.</au><au>Sicard, E.</au><au>Boyer, A.</au><au>Ben Dhia, S.</au><au>Whalen, J.J.</au><au>Hubing, T.H.</au><au>Coenen, M.</au><au>Wada, O.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The Electromagnetic Compatibility of Integrated Circuits-Past, Present, and Future</atitle><jtitle>IEEE Transactions on Electromagnetic Compatibility</jtitle><stitle>TEMC</stitle><date>2009-02-01</date><risdate>2009</risdate><volume>51</volume><issue>1</issue><spage>78</spage><epage>100</epage><pages>78-100</pages><issn>0018-9375</issn><eissn>1558-187X</eissn><coden>IEMCAE</coden><abstract>Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today's billon-transistor system-on-chip, there have always been concerns about the ability of components to operate safely in an increasingly disruptive electromagnetic environment. This paper provides a nonexhaustive review of the research work conducted in the field of electromagnetic compatibility (EMC) at the IC level over the past 40 years. It also brings together a collection of information and trends in IC technology, in order to build a tentative roadmap for the EMC of ICs until the year 2020, with a focus on measurement methods and modeling approaches.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TEMC.2008.2008907</doi><tpages>23</tpages><oa>free_for_read</oa></addata></record>
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issn 0018-9375
1558-187X
language eng
recordid cdi_pascalfrancis_primary_21474028
source IEEE Electronic Library (IEL)
subjects Applied sciences
Design. Technologies. Operation analysis. Testing
Electromagnetic compatibility
Electromagnetics
Electromagnetism
Electronics
Emission
Engineering Sciences
Exact sciences and technology
history
ICs
Information, signal and communications theory
Integrated circuit modeling
Integrated circuits
modeling
roadmap
Semiconductor device measurement
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
susceptibility
System-on-a-chip
Telecommunications and information theory
Transistors
title The Electromagnetic Compatibility of Integrated Circuits-Past, Present, and Future
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T10%3A59%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20Electromagnetic%20Compatibility%20of%20Integrated%20Circuits-Past,%20Present,%20and%20Future&rft.jtitle=IEEE%20Transactions%20on%20Electromagnetic%20Compatibility&rft.au=Ramdani,%20M.&rft.date=2009-02-01&rft.volume=51&rft.issue=1&rft.spage=78&rft.epage=100&rft.pages=78-100&rft.issn=0018-9375&rft.eissn=1558-187X&rft.coden=IEMCAE&rft_id=info:doi/10.1109/TEMC.2008.2008907&rft_dat=%3Cproquest_RIE%3E34710111%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=857226726&rft_id=info:pmid/&rft_ieee_id=4785172&rfr_iscdi=true