The Electromagnetic Compatibility of Integrated Circuits-Past, Present, and Future

Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today's billon-transistor system-on-chip, there have always been concerns about the ability of components to operate safely in an increasingly disruptive electromagnetic env...

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Veröffentlicht in:IEEE Transactions on Electromagnetic Compatibility 2009-02, Vol.51 (1), p.78-100
Hauptverfasser: Ramdani, M., Sicard, E., Boyer, A., Ben Dhia, S., Whalen, J.J., Hubing, T.H., Coenen, M., Wada, O.
Format: Artikel
Sprache:eng
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Zusammenfassung:Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today's billon-transistor system-on-chip, there have always been concerns about the ability of components to operate safely in an increasingly disruptive electromagnetic environment. This paper provides a nonexhaustive review of the research work conducted in the field of electromagnetic compatibility (EMC) at the IC level over the past 40 years. It also brings together a collection of information and trends in IC technology, in order to build a tentative roadmap for the EMC of ICs until the year 2020, with a focus on measurement methods and modeling approaches.
ISSN:0018-9375
1558-187X
DOI:10.1109/TEMC.2008.2008907