A comparison of multivariate statistical analysis protocols for ToF-SIMS spectral images: Multivariate Analysis in Surface Analysis - Part I

Bibliographische Detailangaben

Veröffentlicht in:	Surface and interface analysis 2009, Vol.41 (2), p.88-96
Hauptverfasser:	SMENTKOWSKI, V. S, OSTROWSKI, S. G, KEENAN, M. R
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic, molecular, and ion beam impact and interactions with surfaces Condensed matter: electronic structure, electrical, magnetic, and optical properties Electron and ion emission by liquids and solids impact phenomena Exact sciences and technology Impact phenomena (including electron spectra and sputtering) Mathematical methods in physics Multivariate analysis Physics Probability theory, stochastic processes, and statistics
Online-Zugang:	Volltext
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