Metrology for the Electrical Characterization of Semiconductor Nanowires : Nanowire transistors: modeling, device, desing, and technology

Bibliographische Detailangaben

Veröffentlicht in:	IEEE transactions on electron devices 2008, Vol.55 (11), p.3086-3095
Hauptverfasser:	RICHTER, Curt A, XIONG, Hao D, XIAOXIAO ZHU, WENYONG WANG, STANFORD, Vincent M, HONG, Woong-Ki, LEE, Takhee, IOANNOU, Dimitris E, QILIANG LI
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Electronics Exact sciences and technology Microelectronic fabrication (materials and surfaces technology) Molecular electronics, nanoelectronics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Testing, measurement, noise and reliability
Online-Zugang:	Volltext
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