Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit Operation : Analog Circuits and Related SoC Integration Technologies

Bibliographische Detailangaben

Veröffentlicht in:	IEICE transactions on electronics 2008, Vol.91 (6), p.936-944
Hauptverfasser:	ICHIKAWA, Kouji, TAKAHASHI, Yuki, SAKURAI, Yukihiko, TSUDA, Takahiro, IWASE, Isao, NAGATA, Makoto
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Design. Technologies. Operation analysis. Testing Electrical engineering. Electrical power engineering Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Exact sciences and technology Integrated circuits Power electronics, power supplies Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online-Zugang:	Volltext
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