An Improved Bidirectional SCR Structure for Low-Triggering ESD Protection Applications

An improved dual-polarity silicon-controlled rectifier (SCR) device has been proposed and realized in a 0.6-mum bipolar complementary metal-oxide-semiconductor process. The device can be used to protect electrostatic discharge (ESD) in both the positive and negative directions on pins with a voltage...

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Veröffentlicht in:IEEE electron device letters 2008-04, Vol.29 (4), p.360-362
Hauptverfasser: Zhiwei Liu, Vinson, J., Lifang Lou, Liou, J.J.
Format: Artikel
Sprache:eng
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Zusammenfassung:An improved dual-polarity silicon-controlled rectifier (SCR) device has been proposed and realized in a 0.6-mum bipolar complementary metal-oxide-semiconductor process. The device can be used to protect electrostatic discharge (ESD) in both the positive and negative directions on pins with a voltage range that goes below ground. Comparing with the conventional bidirectional SCR structures, the new device is more suitable for low-voltage integrated circuit ESD protection applications because it possesses a smaller trigger voltage, a smaller leakage current, and a larger holding voltage.
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2008.917111