An Improved Bidirectional SCR Structure for Low-Triggering ESD Protection Applications
An improved dual-polarity silicon-controlled rectifier (SCR) device has been proposed and realized in a 0.6-mum bipolar complementary metal-oxide-semiconductor process. The device can be used to protect electrostatic discharge (ESD) in both the positive and negative directions on pins with a voltage...
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Veröffentlicht in: | IEEE electron device letters 2008-04, Vol.29 (4), p.360-362 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | An improved dual-polarity silicon-controlled rectifier (SCR) device has been proposed and realized in a 0.6-mum bipolar complementary metal-oxide-semiconductor process. The device can be used to protect electrostatic discharge (ESD) in both the positive and negative directions on pins with a voltage range that goes below ground. Comparing with the conventional bidirectional SCR structures, the new device is more suitable for low-voltage integrated circuit ESD protection applications because it possesses a smaller trigger voltage, a smaller leakage current, and a larger holding voltage. |
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ISSN: | 0741-3106 1558-0563 |
DOI: | 10.1109/LED.2008.917111 |