Sputter depth profiling in mineral-surface analysis

The effects of ion bombardment on homogeneous samples of quartz, albite, calcite and anhydrite have been studied with X-ray photoelectron spectroscopy (XPS) in order to study the usefulness and limitations of sputter depth profiles of minerals.

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Bibliographische Detailangaben
Veröffentlicht in:	The American mineralogist 1988-12, Vol.73 (11-12), p.1449-1456
Hauptverfasser:	Hochella, Jr, Lindsay, James R, Mossotti, Victor G, Eggleston, Carrick M
Format:	Artikel
Sprache:	eng
Schlagworte:	albite anhydrite Auger spectroscopy calcite carbonates chemical analysis Earth sciences Earth, ocean, space electron probe Exact sciences and technology experimental studies feldspar group framework silicates Geochemistry ion bombardment methods Mineralogy Mineralogy: general, methodology, regional studies minerals natural materials plagioclase quartz radiation damage silica minerals silicates spectroscopy sputter depth profiling sulfates techniques X-ray spectroscopy
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Beschreibung
Zusammenfassung:	The effects of ion bombardment on homogeneous samples of quartz, albite, calcite and anhydrite have been studied with X-ray photoelectron spectroscopy (XPS) in order to study the usefulness and limitations of sputter depth profiles of minerals.
ISSN:	0003-004X 1945-3027