Direct comparison of quantized hall resistances

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Bibliographische Detailangaben
Veröffentlicht in:	IEEE transactions on instrumentation and measurement 1991-04, Vol.40 (2), p.234-236
Hauptverfasser:	Piquemal, F., Etienne, B., Andre, J.-P., Patillon, J.-N.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bridge circuits Condensed matter: electronic structure, electrical, magnetic, and optical properties Current measurement Detectors Electrical resistance measurement Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Electronic transport in interface structures Exact sciences and technology FETs Gallium arsenide Hall effect Microcomputers Physics Power measurement Uncertainty
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