The Utility of Preparing CU Plots Prior to DLTS Scans

Current practice recommends that a preliminary C versus U plot be made before beginning a DLTS scan of a semiconductor junction to select the required bias for the junction and the temperature range for the scan. We feel that it is more appropriate and meaningful to perform a CU study at a later ti...

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Veröffentlicht in:	Physica status solidi. A, Applied research Applied research, 1991-01, Vol.123 (1), p.341-348
Hauptverfasser:	Gross, W., Halder, N. C.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Electronic transport in interface structures Exact sciences and technology Physics
Online-Zugang:	Volltext
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