A new method to extract angle of refraction in diffraction enhanced imaging computed tomography

A new method to extract the angle of refraction data in diffraction enhanced imaging computed tomography (DEI-CT) is proposed in this paper. In this method the projective data of the refractive angle can be extracted from only one set of projective image data with the sample rotational angle range from 0 deg to 360 deg . This method not only much simplifies the process in the experiment of DEI-CT but can also get rid of some misalignments between two sets of projective image data with the sample rotational angle range from 0 deg to 180 deg , which are taken at the high angle and the low angle of the analyzer crystal, respectively. Using this method, the refractive index and the two derivatives of the refractive index in the plane perpendicular to the rotational axis of the sample can be reconstructed with higher quality than that done by the former ways. Experimental results confirm the new method.