Effects of using a metal layer in total internal reflection fluorescence microscopy : Plasmonics

Bibliographische Detailangaben

Veröffentlicht in:	Applied physics. A, Materials science & processing Materials science & processing, 2007, Vol.89 (2), p.333-335
Hauptverfasser:	TANG, W. T, CHUNG, E, KIM, Y, SO, P. T. C, SHEPPARD, C. J. R
Format:	Artikel
Sprache:	eng
Schlagworte:	Conventional optical microscopes Exact sciences and technology Fundamental areas of phenomenology (including applications) Image forming and processing Imaging and optical processing Instruments, apparatus, components and techniques common to several branches of physics and astronomy Optical instruments, equipment and techniques Optics Physics
Online-Zugang:	Volltext
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