Planning step-stress life-test with a target acceleration-factor
A sequential approach is presented to plan a multiple-steps step-stress accelerated life test (SSALT) with type-I censoring so as to achieve a pre-specified acceleration factor. An initial optimal plan for a simple SSALT, where one not only has to determine the optimum hold-time under low stress but...
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Veröffentlicht in: | IEEE transactions on reliability 1999-03, Vol.48 (1), p.61-67 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A sequential approach is presented to plan a multiple-steps step-stress accelerated life test (SSALT) with type-I censoring so as to achieve a pre-specified acceleration factor. An initial optimal plan for a simple SSALT, where one not only has to determine the optimum hold-time under low stress but also the optimum low stress level, is obtained by solving a constrained nonlinear program. A backward recursion scheme generates the subsequent optimal low-stress levels and hold-times for multiple-step SSALT. An illustration using a 3-step SSALT is presented. The relative efficiency of the 2-step and 3-step SSALT is investigated. A numerical example illustrates the method under 2-step and 3-step SSALT. |
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ISSN: | 0018-9529 1558-1721 |
DOI: | 10.1109/24.765928 |