An Automatic Coverage Analysis for SystemC Using UML and Aspect-Oriented Technology

SystemC can be considered as the best possible language today for system level design and exploration of embedded systems. However, testing SystemC descriptions is still an open issue, since the language is new and researchers are looking for efficient error models and coverage metrics, which can be...

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Hauptverfasser: Chen, Yan, Du, Xuan, Zhou, Xuegong, Peng, Chenglian
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:SystemC can be considered as the best possible language today for system level design and exploration of embedded systems. However, testing SystemC descriptions is still an open issue, since the language is new and researchers are looking for efficient error models and coverage metrics, which can be indifferently applied to hardware and software modules. In this paper we propose a novel approach to automate the test coverage analysis for SystemC descriptions using UML and Aspect-Oriented technology. SystemC meta-model and aspect meta-model are established to support UML customization and extension. They also provide the foundation for aspect weaver and SystemC code generator. Expected functional coverage metric could be extracted from UML timing descriptions so that it is possible to automate the whole test coverage analysis. By using the aspect-oriented technology test functionalities could be added or replaced without modifying the original design. It makes system designs more readable and easier to maintain.
ISSN:0302-9743
1611-3349
DOI:10.1007/11568421_40