A novel approach for on-line testable reversible logic circuit design

Two testable reversible logic gates are proposed in this paper. These gates can be used to implement reversible digital circuits with various levels of complexity. The major feature of these gates is that they provide online-testability for circuits implemented using these gates. The application of...

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Bibliographische Detailangaben
Hauptverfasser:	Vasudevan, D.P., Lala, P.K., Parkerson, J.P.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Adders Applied sciences Benchmark testing Circuit properties Circuit testing Computer science Design. Technologies. Operation analysis. Testing Digital circuits Electric, optical and optoelectronic circuits Electronic circuits Electronics Energy dissipation Exact sciences and technology Integrated circuits Integrated circuits by function (including memories and processors) Logic circuits Logic gates Logic testing Quantum computing Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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Beschreibung
Zusammenfassung:	Two testable reversible logic gates are proposed in this paper. These gates can be used to implement reversible digital circuits with various levels of complexity. The major feature of these gates is that they provide online-testability for circuits implemented using these gates. The application of these gates in testable ripple carry, carry-skip adders and MCNC benchmark circuits have been illustrated.
ISSN:	1081-7735 2377-5386
DOI:	10.1109/ATS.2004.13