Applications of high-resolution MFM system with low-moment probe in a vacuum

Magnetic force microscopy (MFM) is very useful for observing magnetic domain structures. However, due to stray fields from an MFM probe, observations of small magnetic domain structures are limited. The authors have developed a high-resolution MFM system that utilizes a low-moment probe and a qualit...

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Veröffentlicht in:	IEEE transactions on magnetics 2005-10, Vol.41 (10), p.3733-3735
Hauptverfasser:	Yamaoka, T., Watanabe, K., Shirakawabe, Y., Chinone, K., Saitoh, E., Tanaka, M., Miyajima, H.
Format:	Artikel
Sprache:	eng
Schlagworte:	Cross-disciplinary physics: materials science rheology Exact sciences and technology Magnetic devices Magnetic domains Magnetic force microscopy Magnetic forces Magnetism Materials science Nanoscale devices Nanotechnology Other topics in materials science Physics Probes Q factor Springs Vacuum systems
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