In situ diffraction profile analysis during tensile deformation motivated by molecular dynamics

Bibliographische Detailangaben

Hauptverfasser:	VAN SWYGENHOVEN, H, BUDROVIC, Z, DERLET, P. M, FRØSETH, A. G, VAN PETEGEM, S
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Exact sciences and technology Indirect evidence of dislocations and other defects (resistivity, slip, creep, strains, internal friction, epr, nmr, etc.) Mechanical and acoustical properties of condensed matter Mechanical properties of nanoscale materials Physics Structure of solids and liquids crystallography
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!