Scanning Probe Microscopy Study of the Metal-Rich Layered Chalcogenides TaM2Te2 (M = Co, Ni)

The compounds TaNi2Te2 and TaCo2Te2 have been examined by scanning tunneling and atomic force microscopy. The title phases crystallize in layered structures with metal slabs sandwiched by tellurium atoms. Scanning probe microscope images of the surfaces of these materials arise from the surface tell...

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Veröffentlicht in:	Chemistry of materials 1998-12, Vol.10 (12), p.3870-3878
Hauptverfasser:	Neuhausen, Jörg, Evstaf'iev, Vladimir K, Block, Thomas, Finckh, E. Wolfgang, Tremel, Wolfgang, Augustin, Ludger, Fuchs, Harald, Voss, Dirk, Krüger, Peter, Mazur, Albert, Pollmann, Johannes
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Electron, ion, and scanning probe microscopy Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Halides, chalcogenides and analogous compounds of group vb Inorganic compounds Physics Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc Solid surfaces and solid-solid interfaces Structure of solids and liquids crystallography Structure of specific crystalline solids Surface and interface electron states Surface states, band structure, electron density of states Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
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Zusammenfassung:	The compounds TaNi2Te2 and TaCo2Te2 have been examined by scanning tunneling and atomic force microscopy. The title phases crystallize in layered structures with metal slabs sandwiched by tellurium atoms. Scanning probe microscope images of the surfaces of these materials arise from the surface tellurium atoms anddepending on the experimental conditionscan show very different features. The images have been simulated through surface charge densities calculated within the Extended Hückel and LMTO frameworks.
ISSN:	0897-4756 1520-5002
DOI:	10.1021/cm980714x