Liquid helium temperature irradiation effects on the operation of 0.7 μm CMOS devices for cryogenic space applications
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 99 |
|---|---|
| container_issue | |
| container_start_page | 91 |
| container_title | |
| container_volume | |
| creator | MERCHA, A CRETEN, Y PUTZEYS, J MERKEN, P DE MOOR, P CLAEYS, C VAN HOOF, C SIMOEN, E MOHAMMADZADEH, A NICKSON, R |
| description | |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_16546080</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>16546080</sourcerecordid><originalsourceid>FETCH-pascalfrancis_primary_165460803</originalsourceid><addsrcrecordid>eNqNi0FOwzAQRS0oEqH0DrNhGWQnsd2uKxALEAvYVyNnTAclsbEdUO_GGTgTUHEAVv9J7_0TUTXamlppuzkVF0obY22nmvVCVFIZVZvWdudilfOrlLJplVabrhIf9_w2cw97GngeodAYKWGZEwGnhD1j4TABeU-uZPjBsicIx-hXBA_y2sLX5wjbh8cn6OmdHWXwIYFLh_BCEzvIER0BxjiwO_7ypTjzOGRa_e1SXN3ePG_v6ojZ4eATTo7zLiYeMR12yujOyLVs_9t9A8JYU-Y</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Liquid helium temperature irradiation effects on the operation of 0.7 μm CMOS devices for cryogenic space applications</title><source>IOP Publishing Journals</source><creator>MERCHA, A ; CRETEN, Y ; PUTZEYS, J ; MERKEN, P ; DE MOOR, P ; CLAEYS, C ; VAN HOOF, C ; SIMOEN, E ; MOHAMMADZADEH, A ; NICKSON, R</creator><creatorcontrib>MERCHA, A ; CRETEN, Y ; PUTZEYS, J ; MERKEN, P ; DE MOOR, P ; CLAEYS, C ; VAN HOOF, C ; SIMOEN, E ; MOHAMMADZADEH, A ; NICKSON, R</creatorcontrib><identifier>ISSN: 0161-6374</identifier><identifier>ISBN: 1566774128</identifier><identifier>ISBN: 9781566774123</identifier><identifier>EISSN: 2576-1579</identifier><language>eng</language><publisher>Pennington NJ: Electrochemical Society</publisher><subject>Applied sciences ; Design. Technologies. Operation analysis. Testing ; Electronics ; Exact sciences and technology ; Integrated circuits ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Transistors</subject><ispartof>Proceedings - Electrochemical Society, 2003, p.91-99</ispartof><rights>2005 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,778,782,787,788,4038,4039,23919,23920,25129</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16546080$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>MERCHA, A</creatorcontrib><creatorcontrib>CRETEN, Y</creatorcontrib><creatorcontrib>PUTZEYS, J</creatorcontrib><creatorcontrib>MERKEN, P</creatorcontrib><creatorcontrib>DE MOOR, P</creatorcontrib><creatorcontrib>CLAEYS, C</creatorcontrib><creatorcontrib>VAN HOOF, C</creatorcontrib><creatorcontrib>SIMOEN, E</creatorcontrib><creatorcontrib>MOHAMMADZADEH, A</creatorcontrib><creatorcontrib>NICKSON, R</creatorcontrib><title>Liquid helium temperature irradiation effects on the operation of 0.7 μm CMOS devices for cryogenic space applications</title><title>Proceedings - Electrochemical Society</title><subject>Applied sciences</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Integrated circuits</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Transistors</subject><issn>0161-6374</issn><issn>2576-1579</issn><isbn>1566774128</isbn><isbn>9781566774123</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2003</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNqNi0FOwzAQRS0oEqH0DrNhGWQnsd2uKxALEAvYVyNnTAclsbEdUO_GGTgTUHEAVv9J7_0TUTXamlppuzkVF0obY22nmvVCVFIZVZvWdudilfOrlLJplVabrhIf9_w2cw97GngeodAYKWGZEwGnhD1j4TABeU-uZPjBsicIx-hXBA_y2sLX5wjbh8cn6OmdHWXwIYFLh_BCEzvIER0BxjiwO_7ypTjzOGRa_e1SXN3ePG_v6ojZ4eATTo7zLiYeMR12yujOyLVs_9t9A8JYU-Y</recordid><startdate>2003</startdate><enddate>2003</enddate><creator>MERCHA, A</creator><creator>CRETEN, Y</creator><creator>PUTZEYS, J</creator><creator>MERKEN, P</creator><creator>DE MOOR, P</creator><creator>CLAEYS, C</creator><creator>VAN HOOF, C</creator><creator>SIMOEN, E</creator><creator>MOHAMMADZADEH, A</creator><creator>NICKSON, R</creator><general>Electrochemical Society</general><scope>IQODW</scope></search><sort><creationdate>2003</creationdate><title>Liquid helium temperature irradiation effects on the operation of 0.7 μm CMOS devices for cryogenic space applications</title><author>MERCHA, A ; CRETEN, Y ; PUTZEYS, J ; MERKEN, P ; DE MOOR, P ; CLAEYS, C ; VAN HOOF, C ; SIMOEN, E ; MOHAMMADZADEH, A ; NICKSON, R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-pascalfrancis_primary_165460803</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Applied sciences</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Integrated circuits</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Transistors</topic><toplevel>online_resources</toplevel><creatorcontrib>MERCHA, A</creatorcontrib><creatorcontrib>CRETEN, Y</creatorcontrib><creatorcontrib>PUTZEYS, J</creatorcontrib><creatorcontrib>MERKEN, P</creatorcontrib><creatorcontrib>DE MOOR, P</creatorcontrib><creatorcontrib>CLAEYS, C</creatorcontrib><creatorcontrib>VAN HOOF, C</creatorcontrib><creatorcontrib>SIMOEN, E</creatorcontrib><creatorcontrib>MOHAMMADZADEH, A</creatorcontrib><creatorcontrib>NICKSON, R</creatorcontrib><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>MERCHA, A</au><au>CRETEN, Y</au><au>PUTZEYS, J</au><au>MERKEN, P</au><au>DE MOOR, P</au><au>CLAEYS, C</au><au>VAN HOOF, C</au><au>SIMOEN, E</au><au>MOHAMMADZADEH, A</au><au>NICKSON, R</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Liquid helium temperature irradiation effects on the operation of 0.7 μm CMOS devices for cryogenic space applications</atitle><btitle>Proceedings - Electrochemical Society</btitle><date>2003</date><risdate>2003</risdate><spage>91</spage><epage>99</epage><pages>91-99</pages><issn>0161-6374</issn><eissn>2576-1579</eissn><isbn>1566774128</isbn><isbn>9781566774123</isbn><cop>Pennington NJ</cop><pub>Electrochemical Society</pub></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0161-6374 |
| ispartof | Proceedings - Electrochemical Society, 2003, p.91-99 |
| issn | 0161-6374 2576-1579 |
| language | eng |
| recordid | cdi_pascalfrancis_primary_16546080 |
| source | IOP Publishing Journals |
| subjects | Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Transistors |
| title | Liquid helium temperature irradiation effects on the operation of 0.7 μm CMOS devices for cryogenic space applications |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T09%3A03%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Liquid%20helium%20temperature%20irradiation%20effects%20on%20the%20operation%20of%200.7%20%CE%BCm%20CMOS%20devices%20for%20cryogenic%20space%20applications&rft.btitle=Proceedings%20-%20Electrochemical%20Society&rft.au=MERCHA,%20A&rft.date=2003&rft.spage=91&rft.epage=99&rft.pages=91-99&rft.issn=0161-6374&rft.eissn=2576-1579&rft.isbn=1566774128&rft.isbn_list=9781566774123&rft_id=info:doi/&rft_dat=%3Cpascalfrancis%3E16546080%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |