On-chip SiGe transmission line measurements and model verification up to 110 GHz

On-chip microstrip transmission lines have been measured on-wafer from below 1 GHz up to 110 GHz. Using different pad de-embedding techniques as well as a technique based on two transmission lines of different length, the characteristic transmission line parameters have been accurately determined. T...

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Veröffentlicht in:	IEEE microwave and wireless components letters 2005-02, Vol.15 (2), p.65-67
Hauptverfasser:	Zwick, T., Tretiakov, Y., Goren, D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Coplanar transmission lines De-embedding Design. Technologies. Operation analysis. Testing Electromagnetic measurements Electromagnetic modeling Electronics Exact sciences and technology Frequency Germanium silicon alloys Integrated circuits Microstrip Millimeter wave technology on-wafer measurements Predictive models Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Silicon germanium transmission line interconnect Transmission line measurements
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Beschreibung
Zusammenfassung:	On-chip microstrip transmission lines have been measured on-wafer from below 1 GHz up to 110 GHz. Using different pad de-embedding techniques as well as a technique based on two transmission lines of different length, the characteristic transmission line parameters have been accurately determined. The results are compared against simulation results from an electromagnetic full-wave solution and the parametric IBM model which is available in the technology's design kit.
ISSN:	1531-1309 2771-957X 1558-1764 2771-9588
DOI:	10.1109/LMWC.2004.842817