Identification of aging mechanisms for non-destructive pulsed magnets operating in the 60 T range

Pulsed magnets are exposed to mechanical, thermal and electrical stresses whose combined effect shortens their lifetime even in the nondestructive regime. In the end it is often impossible to identify the exact origin of a magnet failure as most of the observed damage results from electric arcs that...

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Veröffentlicht in:IEEE transactions on applied superconductivity 2004-06, Vol.14 (2), p.1237-1240
Hauptverfasser: Billette, J., Lecouturier, F., Portugall, O.
Format: Artikel
Sprache:eng
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Zusammenfassung:Pulsed magnets are exposed to mechanical, thermal and electrical stresses whose combined effect shortens their lifetime even in the nondestructive regime. In the end it is often impossible to identify the exact origin of a magnet failure as most of the observed damage results from electric arcs that can be caused by both insulation breakdowns and conductor ruptures. We report on recent investigations considering both scenarios.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2004.830540