Neighbor selection for variance reduction in IDDO and other parametric data
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| creator | DAASCH, W. Robert COTA, Kevin MCNAMES, James MADGE, Robert |
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| fulltext | fulltext |
| identifier | ISSN: 1089-3539 |
| ispartof | Proceedings - International Test Conference, 2002, p.1240-1248 |
| issn | 1089-3539 |
| language | eng |
| recordid | cdi_pascalfrancis_primary_15530662 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Applied sciences Circuit properties Design. Technologies. Operation analysis. Testing Digital circuits Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Integrated circuits Microelectronic fabrication (materials and surfaces technology) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
| title | Neighbor selection for variance reduction in IDDO and other parametric data |
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