Micro-scale plasticity effects in microvia reliability analaysis

Bibliographische Detailangaben

Hauptverfasser:	RAMAKRISHNA, Gnyaneshwar, PUCHA, Raghuram V, SITARAMAN, Suresh K
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits Materials Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Testing, measurement, noise and reliability
Online-Zugang:	Volltext
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