The magnetic-resonance force microscope: A new tool for high-resolution, 3-D, subsurface scanned probe imaging: Spintronics technology

The magnetic-resonance force microscope: A new tool for high-resolution, 3-D, subsurface scanned probe imaging: Spintronics technology

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Veröffentlicht in:Proceedings of the IEEE 2003, Vol.91 (5), p.789-798
Hauptverfasser: HAMMEL, P. Chris, PELEKHOV, Denis V, WIGEN, Philip E, GOSNELL, Timothy R, MIDZOR, Melissa M, ROUKES, Michael L
Format: Artikel
Sprache:eng
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Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Magnetic force microscopes
Physics
Scanning probe microscopes, components and techniques
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container_issue 5
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container_title Proceedings of the IEEE
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creator HAMMEL, P. Chris
PELEKHOV, Denis V
WIGEN, Philip E
GOSNELL, Timothy R
MIDZOR, Melissa M
ROUKES, Michael L
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source IEEE Electronic Library (IEL)
subjects Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Magnetic force microscopes
Physics
Scanning probe microscopes, components and techniques
title The magnetic-resonance force microscope: A new tool for high-resolution, 3-D, subsurface scanned probe imaging: Spintronics technology
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