On-chip error correcting techniques for new-generation Flash memories: Flash memory technology

Bibliographische Detailangaben

Veröffentlicht in:	Proceedings of the IEEE 2003, Vol.91 (4), p.602-616
Hauptverfasser:	GREGORI, Stefano, CABRINI, Alessandro, KHOURI, Osama, TORELLI, Guido
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits Integrated circuits by function (including memories and processors) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Testing, measurement, noise and reliability
Online-Zugang:	Volltext
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