ToF-SIMS characterization of molecular ions from Fomblin Z-DOL on Ag substrates

Bibliographische Detailangaben

Hauptverfasser:	ABE, Yoshimi, OKUHIRA, Hidekazu
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Atomic, molecular, and ion beam impact and interactions with surfaces Condensed matter: electronic structure, electrical, magnetic, and optical properties Electron and ion emission by liquids and solids impact phenomena Exact sciences and technology Impact phenomena (including electron spectra and sputtering) Physics
Online-Zugang:	Volltext
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