Insights into the mechanisms of light-induced degradation from studies of defects in low Ge fraction a-Si, Ge:H alloys
Gespeichert in:
| Hauptverfasser: | , , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 454 |
|---|---|
| container_issue | |
| container_start_page | 449 |
| container_title | |
| container_volume | 299302 |
| creator | COHEN, J. David HEATH, Jennifer PALINGINIS, Kimon YANG, Jeffrey C GUHA, Subhendu |
| description | |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>pascalfrancis</sourceid><recordid>TN_cdi_pascalfrancis_primary_14155674</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>14155674</sourcerecordid><originalsourceid>FETCH-pascalfrancis_primary_141556743</originalsourceid><addsrcrecordid>eNqNjMFuwjAQRK2qSKSFf9hLb7WUxIGkvVYtcKZ3tLI3ZJFjo6xpxd83jfgA5jLSzJt5UFnR1EZXTVE-qizPy1Kb_M3M1ZPIKR9VmyZTP7sgfOySAIcUIXUEPdkOA0svEFvw_63m4C6WHDg6DugwcQzQDrEHSRfHNJGOWrLTEfj4CxsaCbQTinrPr2PyvgX0Pl5loWYteqHlzZ_Vy9fn98dWn1Es-nEYLMvhPHCPw_VQVMVqta4rcy_3B_h9T2E</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Insights into the mechanisms of light-induced degradation from studies of defects in low Ge fraction a-Si, Ge:H alloys</title><source>ScienceDirect Journals (5 years ago - present)</source><creator>COHEN, J. David ; HEATH, Jennifer ; PALINGINIS, Kimon ; YANG, Jeffrey C ; GUHA, Subhendu</creator><creatorcontrib>COHEN, J. David ; HEATH, Jennifer ; PALINGINIS, Kimon ; YANG, Jeffrey C ; GUHA, Subhendu</creatorcontrib><identifier>ISSN: 0022-3093</identifier><identifier>EISSN: 1873-4812</identifier><identifier>CODEN: JNCSBJ</identifier><language>eng</language><publisher>Amsterdam: Elsevier</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Conductivity of specific materials ; Disordered solids ; Disordered structures; amorphous and glassy solids ; Electron states ; Electronic transport in condensed matter ; Exact sciences and technology ; Impurity and defect levels ; Physics</subject><ispartof>Journal of non-crystalline solids, 2002, Vol.299302, p.449-454</ispartof><rights>2002 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,776,780,785,786,4036,4037,23909,23910,25118</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=14155674$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>COHEN, J. David</creatorcontrib><creatorcontrib>HEATH, Jennifer</creatorcontrib><creatorcontrib>PALINGINIS, Kimon</creatorcontrib><creatorcontrib>YANG, Jeffrey C</creatorcontrib><creatorcontrib>GUHA, Subhendu</creatorcontrib><title>Insights into the mechanisms of light-induced degradation from studies of defects in low Ge fraction a-Si, Ge:H alloys</title><title>Journal of non-crystalline solids</title><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Conductivity of specific materials</subject><subject>Disordered solids</subject><subject>Disordered structures; amorphous and glassy solids</subject><subject>Electron states</subject><subject>Electronic transport in condensed matter</subject><subject>Exact sciences and technology</subject><subject>Impurity and defect levels</subject><subject>Physics</subject><issn>0022-3093</issn><issn>1873-4812</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2002</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNqNjMFuwjAQRK2qSKSFf9hLb7WUxIGkvVYtcKZ3tLI3ZJFjo6xpxd83jfgA5jLSzJt5UFnR1EZXTVE-qizPy1Kb_M3M1ZPIKR9VmyZTP7sgfOySAIcUIXUEPdkOA0svEFvw_63m4C6WHDg6DugwcQzQDrEHSRfHNJGOWrLTEfj4CxsaCbQTinrPr2PyvgX0Pl5loWYteqHlzZ_Vy9fn98dWn1Es-nEYLMvhPHCPw_VQVMVqta4rcy_3B_h9T2E</recordid><startdate>2002</startdate><enddate>2002</enddate><creator>COHEN, J. David</creator><creator>HEATH, Jennifer</creator><creator>PALINGINIS, Kimon</creator><creator>YANG, Jeffrey C</creator><creator>GUHA, Subhendu</creator><general>Elsevier</general><scope>IQODW</scope></search><sort><creationdate>2002</creationdate><title>Insights into the mechanisms of light-induced degradation from studies of defects in low Ge fraction a-Si, Ge:H alloys</title><author>COHEN, J. David ; HEATH, Jennifer ; PALINGINIS, Kimon ; YANG, Jeffrey C ; GUHA, Subhendu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-pascalfrancis_primary_141556743</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Conductivity of specific materials</topic><topic>Disordered solids</topic><topic>Disordered structures; amorphous and glassy solids</topic><topic>Electron states</topic><topic>Electronic transport in condensed matter</topic><topic>Exact sciences and technology</topic><topic>Impurity and defect levels</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>COHEN, J. David</creatorcontrib><creatorcontrib>HEATH, Jennifer</creatorcontrib><creatorcontrib>PALINGINIS, Kimon</creatorcontrib><creatorcontrib>YANG, Jeffrey C</creatorcontrib><creatorcontrib>GUHA, Subhendu</creatorcontrib><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>COHEN, J. David</au><au>HEATH, Jennifer</au><au>PALINGINIS, Kimon</au><au>YANG, Jeffrey C</au><au>GUHA, Subhendu</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Insights into the mechanisms of light-induced degradation from studies of defects in low Ge fraction a-Si, Ge:H alloys</atitle><btitle>Journal of non-crystalline solids</btitle><date>2002</date><risdate>2002</risdate><volume>299302</volume><spage>449</spage><epage>454</epage><pages>449-454</pages><issn>0022-3093</issn><eissn>1873-4812</eissn><coden>JNCSBJ</coden><cop>Amsterdam</cop><pub>Elsevier</pub></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0022-3093 |
| ispartof | Journal of non-crystalline solids, 2002, Vol.299302, p.449-454 |
| issn | 0022-3093 1873-4812 |
| language | eng |
| recordid | cdi_pascalfrancis_primary_14155674 |
| source | ScienceDirect Journals (5 years ago - present) |
| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Conductivity of specific materials Disordered solids Disordered structures amorphous and glassy solids Electron states Electronic transport in condensed matter Exact sciences and technology Impurity and defect levels Physics |
| title | Insights into the mechanisms of light-induced degradation from studies of defects in low Ge fraction a-Si, Ge:H alloys |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T19%3A21%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Insights%20into%20the%20mechanisms%20of%20light-induced%20degradation%20from%20studies%20of%20defects%20in%20low%20Ge%20fraction%20a-Si,%20Ge:H%20alloys&rft.btitle=Journal%20of%20non-crystalline%20solids&rft.au=COHEN,%20J.%20David&rft.date=2002&rft.volume=299302&rft.spage=449&rft.epage=454&rft.pages=449-454&rft.issn=0022-3093&rft.eissn=1873-4812&rft.coden=JNCSBJ&rft_id=info:doi/&rft_dat=%3Cpascalfrancis%3E14155674%3C/pascalfrancis%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |