General characteristics of crack arrays in epilayers grown under tensile strain

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Veröffentlicht in:	Semiconductor science and technology 2000-04, Vol.15 (4), p.325-330
Hauptverfasser:	Murray, R T, Kiely, C J, Hopkinson, M
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Fatigue, brittleness, fracture, and cracks Mechanical and acoustical properties Mechanical and acoustical properties of condensed matter Mechanical properties of solids Physical properties of thin films, nonelectronic Physics Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
Online-Zugang:	Volltext
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