Overgrowth of submicron-patterned surfaces for buried index contrast devices

Bibliographische Detailangaben

Veröffentlicht in:	Semiconductor science and technology 2000-04, Vol.15 (4), p.R1-R2
Hauptverfasser:	Koontz, E M, Petrich, G S, Kolodziejski, L A, Goorsky, M S
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of bulk materials and thin films Physics
Online-Zugang:	Volltext
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