Characterization of polycrystalline Cu(In, Ga)Te2 thin films prepared by pulsed laser deposition

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Veröffentlicht in:	Thin solid films 2001, Vol.394 (1-2), p.24-29
Hauptverfasser:	GREMENOK, V. F, MARTIN, R. W, ERMAKOV, O. V, FAUNCE, C. A, PILKINGTON, R. D, HILL, A. E, TOMLINSON, R. D, BODNAR, I. V, YAKUSHEV, M. V, SCHMITZ, W, BENTE, K, MARTIL, I, MARTINEZ, F. L, ZARETSKAYA, E. P, VICTOROV, I. A
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Electrical properties of specific thin films Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Laser deposition Materials science Methods of deposition of films and coatings film growth and epitaxy Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Other inorganic semiconductors Other semiconductors Physics Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology
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ISSN:	0040-6090 1879-2731