Thermal conductivity measurement of submicron-thick films deposited on substrates by modified ac calorimetry (laser-heating Ångstrom method)

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Veröffentlicht in:	International journal of thermophysics 2001-03, Vol.22 (2), p.617-629
Hauptverfasser:	KATO, R, MAESONO, A, TYE, R. P
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Nonelectronic thermal conduction and heat-pulse propagation in solids thermal waves Physical properties of thin films, nonelectronic Physics Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thermal stability thermal effects Transport properties of condensed matter (nonelectronic)
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