Defect-Mediated Polarization Switching in Ferroelectrics and Related Materials: From Mesoscopic Mechanisms to Atomistic Control

The plethora of lattice and electronic behaviors in ferroelectric and multiferroic materials and heterostructures opens vistas into novel physical phenomena including magnetoelectric coupling and ferroelectric tunneling. The development of new classes of electronic, energy‐storage, and information‐t...

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Veröffentlicht in:Advanced materials (Weinheim) 2010-01, Vol.22 (3), p.314-322
Hauptverfasser: Kalinin, Sergei V., Rodriguez, Brian J., Borisevich, Albina Y., Baddorf, Arthur P., Balke, Nina, Chang, Hye Jung, Chen, Long-Qing, Choudhury, Samrat, Jesse, Stephen, Maksymovych, Peter, Nikiforov, Maxim P., Pennycook, Stephen J.
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Sprache:eng
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Zusammenfassung:The plethora of lattice and electronic behaviors in ferroelectric and multiferroic materials and heterostructures opens vistas into novel physical phenomena including magnetoelectric coupling and ferroelectric tunneling. The development of new classes of electronic, energy‐storage, and information‐technology devices depends critically on understanding and controlling field‐induced polarization switching. Polarization reversal is controlled by defects that determine activation energy, critical switching bias, and the selection between thermodynamically equivalent polarization states in multiaxial ferroelectrics. Understanding and controlling defect functionality in ferroelectric materials is as critical to the future of oxide electronics and solid‐state electrochemistry as defects in semiconductors are for semiconductor electronics. Here, recent advances in understanding the defect‐mediated switching mechanisms, enabled by recent advances in electron and scanning probe microscopy, are discussed. The synergy between local probes and structural methods offers a pathway to decipher deterministic polarization switching mechanisms on the level of a single atomically defined defect. Bias‐induced phase transitions in ferroelectric and related materials underpin a range of information and energy storage technologies. The mechanisms of these transitions are controlled by local defects. The synergy of scanning probe microscopy, defect‐engineered structures, electron microscopy, focused X‐ray microprobes, and neural‐network‐based data‐analysis routines holds the promise of understanding atomistic and mesoscopic mechanisms of these transitions on a single‐defect level (see image).
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.200900813