Trace analysis by heavy ion induced X-ray emission

Trace analysis by heavy ion induced X-ray emission

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Veröffentlicht in:Mikrochimica acta (1966) 2000-01, Vol.133 (1-4), p.313-317
Hauptverfasser: ECKER, K. H, WEISE, H.-P, MERKLE, K. L
Format: Artikel
Sprache:eng
Schlagworte:
ANL
ATOMIC AND MOLECULAR PHYSICS
Atomic properties and interactions with photons
Auger effect and inner-shell excitation or ionization
EMISSION
Exact sciences and technology
HEAVY IONS
Photon interactions with atoms
Physics
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container_end_page 317
container_issue 1-4
container_start_page 313
container_title Mikrochimica acta (1966)
container_volume 133
creator ECKER, K. H
WEISE, H.-P
MERKLE, K. L
description
doi_str_mv 10.1007/s006040070112
format Article
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ispartof Mikrochimica acta (1966), 2000-01, Vol.133 (1-4), p.313-317
issn 0026-3672
1436-5073
language eng
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source Springer Nature - Complete Springer Journals
subjects ANL
ATOMIC AND MOLECULAR PHYSICS
Atomic properties and interactions with photons
Auger effect and inner-shell excitation or ionization
EMISSION
Exact sciences and technology
HEAVY IONS
Photon interactions with atoms
Physics
title Trace analysis by heavy ion induced X-ray emission
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