High-resolution x-ray topography of dislocations in 4H-SiC epilayers
Synchrotron x-ray topography with a high-resolution setup using 1128 reflection was carried out on 4H-SiC epilayers. Four different shapes of threading-edge dislocation according to Burgers vector direction were observed. The four types of threading-edge dislocation images were calculated by compute...
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Veröffentlicht in: | Journal of materials research 2007-04, Vol.22 (4), p.845-849 |
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Sprache: | eng |
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