Imaging the life story of nanotube devices

Imaging the life story of nanotube devices

Live imaging of operating multiwall carbon nanotube (MWCNT-) based electronic devices is performed by high resolution transmission electron microscopy. Our measurements allow us to correlate electronic transport with changes in device structure. Surface contamination, contact annealing, and sequenti...

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Veröffentlicht in:Applied physics letters 2005-08, Vol.87 (8), p.083103-083103-3
Hauptverfasser: Yuzvinsky, T. D., Mickelson, W., Aloni, S., Konsek, S. L., Fennimore, A. M., Begtrup, G. E., Kis, A., Regan, B. C., Zettl, A.
Format: Artikel
Sprache:eng
Schlagworte:
36
ANNEALING
CARBON
CONFIGURATION
NANOTUBES
REMOVAL
RESOLUTION
SURFACE CONTAMINATION
TRANSMISSION ELECTRON MICROSCOPY
TRANSPORT
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Beschreibung
Zusammenfassung:Live imaging of operating multiwall carbon nanotube (MWCNT-) based electronic devices is performed by high resolution transmission electron microscopy. Our measurements allow us to correlate electronic transport with changes in device structure. Surface contamination, contact annealing, and sequential wall removal are observed. Temperature profiles confirm diffusive conduction in MWCNTs in the high bias limit. This technique provides a general platform for studying nanoscale systems, where geometric configuration and electronic transport are intimately connected.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2012529