Spin-dependent Fabry-Pérot interference from a cu thin film grown on fcc Co(001)

Spin-dependent electron reflection from a Cu thin film grown on Co/Cu(001) was investigated using spin-polarized low-energy electron microscopy (SPLEEM). Fabry-Pe rot type interference was observed and is explained using the phase accumulation model. SPLEEM images of the Cu overlayer reveal magnetic domains in the Co underlayer, with the domain contrast oscillating with electron energy and Cu film thickness. This behavior is attributed to the spin-dependent electron reflectivity at the Cu/Co interface which leads to spin-dependent Fabry-Pe rot electron interference in the Cu film.