Local plasticity of Al thin films as revealed by x-ray microdiffraction

Grain-to-grain interactions dominate the plasticity of Al thin films and establish effective length scales smaller than the grain size. We have measured large strain distributions and their changes under plastic strain in 1.5-microm-thick Al 0.5% Cu films using a 0.8-microm-diameter white x-ray prob...

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Veröffentlicht in:Physical review letters 2003-03, Vol.90 (9), p.096102-096102, Article 096102
Hauptverfasser: Spolenak, R, Brown, W L, Tamura, N, MacDowell, A A, Celestre, R S, Padmore, H A, Valek, B, Bravman, J C, Marieb, T, Fujimoto, H, Batterman, B W, Patel, J R
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Sprache:eng
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Zusammenfassung:Grain-to-grain interactions dominate the plasticity of Al thin films and establish effective length scales smaller than the grain size. We have measured large strain distributions and their changes under plastic strain in 1.5-microm-thick Al 0.5% Cu films using a 0.8-microm-diameter white x-ray probe at the Advanced Light Source. Strain distributions arise not only from the distribution of grain sizes and orientation, but also from the differences in grain shape and from stress environment. Multiple active glide plane domains have been found within single grains. Large grains behave like multiple smaller grains even before a dislocation substructure can evolve.
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.90.096102