X-ray emission spectra and interfacial solid-phase reactions in Hf/Si(001)Si systems
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| Veröffentlicht in: | Thin solid films 1999-08, Vol.350 (N1-2) |
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| container_issue | N1-2 |
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| container_title | Thin solid films |
| container_volume | 350 |
| creator | Galakhov, V.R. Kurmaev, E.Z. Shamin, S.N. Fedorenko, V.V. Elokhina, L.V. Pivin, J.C. Zaima, S. Kojima, J. |
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| doi_str_mv | 10.1016/S0040-6090(99)00266-7 |
| format | Article |
| fullrecord | <record><control><sourceid>osti</sourceid><recordid>TN_cdi_osti_scitechconnect_800570</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>800570</sourcerecordid><originalsourceid>FETCH-osti_scitechconnect_8005703</originalsourceid><addsrcrecordid>eNqNzT0LwjAUheEgCtaPnyDETYfoTautmUXp3g5uEtKUXqmp5Gbx35tBnJ3O8nBexlYSdhJkvq8ADiByULBRaguQ5rkoRiyRp0KJtMjkmCU_MmUzogcAyDTNElbfhNdvbp9IhIPj9LImeM21azi6YH2rDeqe09BjI16dJsu91SZETFHwst1XuIl32wo5vSnYJy3YpNU92eV352x9vdTnUgwU8E4GgzWdGZyLrfsJ4FhA9o_5AFDURgU</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>X-ray emission spectra and interfacial solid-phase reactions in Hf/Si(001)Si systems</title><source>Elsevier ScienceDirect Journals</source><creator>Galakhov, V.R. ; Kurmaev, E.Z. ; Shamin, S.N. ; Fedorenko, V.V. ; Elokhina, L.V. ; Pivin, J.C. ; Zaima, S. ; Kojima, J.</creator><creatorcontrib>Galakhov, V.R. ; Kurmaev, E.Z. ; Shamin, S.N. ; Fedorenko, V.V. ; Elokhina, L.V. ; Pivin, J.C. ; Zaima, S. ; Kojima, J. ; Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)</creatorcontrib><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>DOI: 10.1016/S0040-6090(99)00266-7</identifier><language>eng</language><publisher>United States</publisher><subject>ADVANCED LIGHT SOURCE ; ADVANCED LIGHT SOURCE ALS ; EMISSION SPECTRA ; INTERFACES ; PARTICLE ACCELERATORS</subject><ispartof>Thin solid films, 1999-08, Vol.350 (N1-2)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,778,782,883,27907,27908</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/800570$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Galakhov, V.R.</creatorcontrib><creatorcontrib>Kurmaev, E.Z.</creatorcontrib><creatorcontrib>Shamin, S.N.</creatorcontrib><creatorcontrib>Fedorenko, V.V.</creatorcontrib><creatorcontrib>Elokhina, L.V.</creatorcontrib><creatorcontrib>Pivin, J.C.</creatorcontrib><creatorcontrib>Zaima, S.</creatorcontrib><creatorcontrib>Kojima, J.</creatorcontrib><creatorcontrib>Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)</creatorcontrib><title>X-ray emission spectra and interfacial solid-phase reactions in Hf/Si(001)Si systems</title><title>Thin solid films</title><subject>ADVANCED LIGHT SOURCE</subject><subject>ADVANCED LIGHT SOURCE ALS</subject><subject>EMISSION SPECTRA</subject><subject>INTERFACES</subject><subject>PARTICLE ACCELERATORS</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><recordid>eNqNzT0LwjAUheEgCtaPnyDETYfoTautmUXp3g5uEtKUXqmp5Gbx35tBnJ3O8nBexlYSdhJkvq8ADiByULBRaguQ5rkoRiyRp0KJtMjkmCU_MmUzogcAyDTNElbfhNdvbp9IhIPj9LImeM21azi6YH2rDeqe09BjI16dJsu91SZETFHwst1XuIl32wo5vSnYJy3YpNU92eV352x9vdTnUgwU8E4GgzWdGZyLrfsJ4FhA9o_5AFDURgU</recordid><startdate>19990815</startdate><enddate>19990815</enddate><creator>Galakhov, V.R.</creator><creator>Kurmaev, E.Z.</creator><creator>Shamin, S.N.</creator><creator>Fedorenko, V.V.</creator><creator>Elokhina, L.V.</creator><creator>Pivin, J.C.</creator><creator>Zaima, S.</creator><creator>Kojima, J.</creator><scope>OTOTI</scope></search><sort><creationdate>19990815</creationdate><title>X-ray emission spectra and interfacial solid-phase reactions in Hf/Si(001)Si systems</title><author>Galakhov, V.R. ; Kurmaev, E.Z. ; Shamin, S.N. ; Fedorenko, V.V. ; Elokhina, L.V. ; Pivin, J.C. ; Zaima, S. ; Kojima, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-osti_scitechconnect_8005703</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><topic>ADVANCED LIGHT SOURCE</topic><topic>ADVANCED LIGHT SOURCE ALS</topic><topic>EMISSION SPECTRA</topic><topic>INTERFACES</topic><topic>PARTICLE ACCELERATORS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Galakhov, V.R.</creatorcontrib><creatorcontrib>Kurmaev, E.Z.</creatorcontrib><creatorcontrib>Shamin, S.N.</creatorcontrib><creatorcontrib>Fedorenko, V.V.</creatorcontrib><creatorcontrib>Elokhina, L.V.</creatorcontrib><creatorcontrib>Pivin, J.C.</creatorcontrib><creatorcontrib>Zaima, S.</creatorcontrib><creatorcontrib>Kojima, J.</creatorcontrib><creatorcontrib>Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)</creatorcontrib><collection>OSTI.GOV</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Galakhov, V.R.</au><au>Kurmaev, E.Z.</au><au>Shamin, S.N.</au><au>Fedorenko, V.V.</au><au>Elokhina, L.V.</au><au>Pivin, J.C.</au><au>Zaima, S.</au><au>Kojima, J.</au><aucorp>Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>X-ray emission spectra and interfacial solid-phase reactions in Hf/Si(001)Si systems</atitle><jtitle>Thin solid films</jtitle><date>1999-08-15</date><risdate>1999</risdate><volume>350</volume><issue>N1-2</issue><issn>0040-6090</issn><eissn>1879-2731</eissn><cop>United States</cop><doi>10.1016/S0040-6090(99)00266-7</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0040-6090 |
| ispartof | Thin solid films, 1999-08, Vol.350 (N1-2) |
| issn | 0040-6090 1879-2731 |
| language | eng |
| recordid | cdi_osti_scitechconnect_800570 |
| source | Elsevier ScienceDirect Journals |
| subjects | ADVANCED LIGHT SOURCE ADVANCED LIGHT SOURCE ALS EMISSION SPECTRA INTERFACES PARTICLE ACCELERATORS |
| title | X-ray emission spectra and interfacial solid-phase reactions in Hf/Si(001)Si systems |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T01%3A27%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-osti&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=X-ray%20emission%20spectra%20and%20interfacial%20solid-phase%20reactions%20in%20Hf/Si(001)Si%20systems&rft.jtitle=Thin%20solid%20films&rft.au=Galakhov,%20V.R.&rft.aucorp=Ernest%20Orlando%20Lawrence%20Berkeley%20National%20Lab.,%20Advanced%20Light%20Source,%20Berkeley,%20CA%20(US)&rft.date=1999-08-15&rft.volume=350&rft.issue=N1-2&rft.issn=0040-6090&rft.eissn=1879-2731&rft_id=info:doi/10.1016/S0040-6090(99)00266-7&rft_dat=%3Costi%3E800570%3C/osti%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |