Dimensions of luminescent oxidized and porous silicon structures

X-ray absorption measurements from H-passivated porous Si and from oxidized Si nanocrystals, combined with electron microscopy, ir absorption, [alpha] recoil, and luminescence emission data, provide a consistent structural picture of the species responsible for the visible luminescence observed in t...

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Veröffentlicht in:Physical review letters 1994-04, Vol.72 (16), p.2648-2651
Hauptverfasser: Schuppler, S, Friedman, SL, Marcus, MA, Adler, DL, Xie, Y, Ross, FM, Harris, TD, Brown, WL, Chabal, YJ, Brus, LE, Citrin, PH
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Sprache:eng
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Zusammenfassung:X-ray absorption measurements from H-passivated porous Si and from oxidized Si nanocrystals, combined with electron microscopy, ir absorption, [alpha] recoil, and luminescence emission data, provide a consistent structural picture of the species responsible for the visible luminescence observed in these samples. The mass-weighted average structures in por-Si are particles, not wires, with dimensions significantly smaller than previously reported or proposed.
ISSN:0031-9007
1079-7114
DOI:10.1103/physrevlett.72.2648