Dimensions of luminescent oxidized and porous silicon structures
X-ray absorption measurements from H-passivated porous Si and from oxidized Si nanocrystals, combined with electron microscopy, ir absorption, [alpha] recoil, and luminescence emission data, provide a consistent structural picture of the species responsible for the visible luminescence observed in t...
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Veröffentlicht in: | Physical review letters 1994-04, Vol.72 (16), p.2648-2651 |
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Hauptverfasser: | , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | X-ray absorption measurements from H-passivated porous Si and from oxidized Si nanocrystals, combined with electron microscopy, ir absorption, [alpha] recoil, and luminescence emission data, provide a consistent structural picture of the species responsible for the visible luminescence observed in these samples. The mass-weighted average structures in por-Si are particles, not wires, with dimensions significantly smaller than previously reported or proposed. |
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ISSN: | 0031-9007 1079-7114 |
DOI: | 10.1103/physrevlett.72.2648 |