Total dose effects on negative voltage regulator

Functional failure at low dose level (4 Krad(Si)) on voltage regulators (LM137) from different manufacturers are analysed. Dose rate effects on parts hardness are evaluated, showing that lowering the dose rate degrade more the IC's in the range 55 rad(Si)/s-0.8 rad(Si)/s. A failure mechanism is...

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Veröffentlicht in:	IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) 1994-12, Vol.41 (6), p.2420-2426
Hauptverfasser:	Beaucour, J., Carriere, T., Gach, A., Laxague, D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences BETA DECAY RADIOISOTOPES BETA-MINUS DECAY RADIOISOTOPES Circuit analysis Circuit simulation COBALT 60 COBALT ISOTOPES COMPUTERIZED SIMULATION DATA Degradation Electric variables measurement ELECTRONIC CIRCUITS Electronics Exact sciences and technology EXPERIMENTAL DATA Failure analysis INFORMATION INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY INTEGRATED CIRCUITS INTERMEDIATE MASS NUCLEI INTERNAL CONVERSION RADIOISOTOPES ISOMERIC TRANSITION ISOTOPES ISOTOPES Manufacturing MICROELECTRONIC CIRCUITS MINUTES LIVING RADIOISOTOPES NUCLEI NUMERICAL DATA ODD-ODD NUCLEI PHYSICAL RADIATION EFFECTS Probes RADIATION EFFECTS RADIOISOTOPES Regulators SIMULATION SPICE Testing, measurement, noise and reliability Voltage measurement VOLTAGE REGULATORS YEARS LIVING RADIOISOT 440200 > Radiation Effects on Instrument Components, Instruments, or Electronic Systems
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Zusammenfassung:	Functional failure at low dose level (4 Krad(Si)) on voltage regulators (LM137) from different manufacturers are analysed. Dose rate effects on parts hardness are evaluated, showing that lowering the dose rate degrade more the IC's in the range 55 rad(Si)/s-0.8 rad(Si)/s. A failure mechanism is proposed, mainly based on circuit analysis, voltage contrast measurements, local irradiation and local electrical measurements with probe station. A SPICE simulation was performed, providing quantitative informations on the degradation. In the light of such a failure analysis and dose rate effects, practical implications on radiation assurance are discussed.< >
ISSN:	0018-9499 1558-1578
DOI:	10.1109/23.340597