Single event effect ground test results for a fiber optic data interconnect and associated electronics

As spacecraft unlock the potential of fiber optics for spaceflight applications, system level bit error rates become of concern to the system designer. We present ground test data and analysis on candidate system components.< >

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Veröffentlicht in:IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) 1994-12, Vol.41 (6), p.1999-2004
Hauptverfasser: LaBel, K.A., Hawkins, D.K., Cooley, J.A., Seidleck, C.M., Marshall, P., Dale, C., Gates, M.M., Kim, H.S., Stassinopoulos, E.G.
Format: Artikel
Sprache:eng
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Zusammenfassung:As spacecraft unlock the potential of fiber optics for spaceflight applications, system level bit error rates become of concern to the system designer. We present ground test data and analysis on candidate system components.< >
ISSN:0018-9499
1558-1578
DOI:10.1109/23.340535